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Home Country France Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices Program Fulbright Visiting Scholar Program Program Country France Grant Activity Type Research Discipline Engineering Specialization Electrical Engineering Academic Year 2014-2015 Dates October 2014 - August 2015 Flex No Scholar type Non-U.S. (Visiting) Scholar Project Title Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices Scholar Information Grantee David Mele Title Ph.D. Candidate Institution National Center of Scientific Research Host Institutions Institution Georgia Institute of Technology Faculty Samuel Graham Host Department Woodruff School of Mechanical Engineering
Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices Program Fulbright Visiting Scholar Program Program Country France Grant Activity Type Research Discipline Engineering Specialization Electrical Engineering Academic Year 2014-2015 Dates October 2014 - August 2015 Flex No Scholar type Non-U.S. (Visiting) Scholar Project Title Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices Scholar Information Grantee David Mele Title Ph.D. Candidate Institution National Center of Scientific Research Host Institutions Institution Georgia Institute of Technology Faculty Samuel Graham Host Department Woodruff School of Mechanical Engineering